Exploring Wafer Map Failure Pattern Classification Using Deep Learning
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Stanford graduate school class CS230 Fall 2019 Project, by SCPD students, Jie and Chen, Stanford graduate school class CS230 Fall 2019 Project, by SCPD students, Jie and Chen, Reference Number: 1982 Title: Development of Intelligent Increase the accuracy and efficiency of surface defects detection
Bonus section for my class,
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